lk/linux-kernel-test
1
0
Fork 0
Code Issues Pull Requests Releases Wiki Activity

staging: iio: lis3l02dq add _type attributes for all scan elements

Browse Source 
Also, adds a macro to make defining such attributes simple.

Signed-off-by: Jonathan Cameron <jic23@cam.ac.uk>
Signed-off-by: Manuel Stahl <manuel.stahl@iis.fraunhofer.de>
Signed-off-by: Greg Kroah-Hartman <gregkh@suse.de>
This commit is contained in:
Jonathan Cameron
2010-09-21 14:40:47 +01:00
committed by Greg Kroah-Hartman
parent cf2b448852
commit 6a36e618b4
2 changed files with 14 additions and 1 deletions
Download Patch File Download Diff File Expand all files Collapse all files

4
drivers/staging/iio/accel/lis3l02dq_ring.c
View File

@@ -84,13 +84,17 @@ static IIO_SCAN_EL_C(accel_y, 1, IIO_SIGNED(16),
static IIO_SCAN_EL_C(accel_z, 2, IIO_SIGNED(16), static IIO_SCAN_EL_C(accel_z, 2, IIO_SIGNED(16),
LIS3L02DQ_REG_OUT_Z_L_ADDR, LIS3L02DQ_REG_OUT_Z_L_ADDR,
&lis3l02dq_scan_el_set_state); &lis3l02dq_scan_el_set_state);
static IIO_CONST_ATTR_SCAN_EL_TYPE(accel, s, 12, 16);
static IIO_SCAN_EL_TIMESTAMP(3); static IIO_SCAN_EL_TIMESTAMP(3);
static IIO_CONST_ATTR_SCAN_EL_TYPE(timestamp, s, 64, 64);
static struct attribute *lis3l02dq_scan_el_attrs[] = { static struct attribute *lis3l02dq_scan_el_attrs[] = {
&iio_scan_el_accel_x.dev_attr.attr, &iio_scan_el_accel_x.dev_attr.attr,
&iio_scan_el_accel_y.dev_attr.attr, &iio_scan_el_accel_y.dev_attr.attr,
&iio_scan_el_accel_z.dev_attr.attr, &iio_scan_el_accel_z.dev_attr.attr,
&iio_const_attr_accel_type.dev_attr.attr,
&iio_scan_el_timestamp.dev_attr.attr, &iio_scan_el_timestamp.dev_attr.attr,
&iio_const_attr_timestamp_type.dev_attr.attr,
NULL, NULL,
}; };

11
drivers/staging/iio/ring_generic.h
View File

@@ -247,7 +247,7 @@ ssize_t iio_scan_el_ts_show(struct device *dev, struct device_attribute *attr,
.bit_count = _bits, \ .bit_count = _bits, \
.label = _label, \ .label = _label, \
.set_state = _controlfunc, \ .set_state = _controlfunc, \
} }
#define IIO_SCAN_EL_C(_name, _number, _bits, _label, _controlfunc) \ #define IIO_SCAN_EL_C(_name, _number, _bits, _label, _controlfunc) \
__IIO_SCAN_EL_C(_name, _number, _bits, _label, _controlfunc) __IIO_SCAN_EL_C(_name, _number, _bits, _label, _controlfunc)
@@ -279,6 +279,15 @@ ssize_t iio_scan_el_ts_show(struct device *dev, struct device_attribute *attr,
iio_scan_el_ts_store), \ iio_scan_el_ts_store), \
} }
/**
* IIO_CONST_ATTR_SCAN_EL_TYPE - attr to specify the data format of a scan el
* @name: the scan el name (may be more general and cover a set of scan elements
* @_sign: either s or u for signed or unsigned
* @_bits: number of actual bits occuplied by the value
* @_storagebits: number of bits _bits is padded to when read out of buffer
**/
#define IIO_CONST_ATTR_SCAN_EL_TYPE(_name, _sign, _bits, _storagebits) \
IIO_CONST_ATTR(_name##_type, #_sign#_bits"/"#_storagebits);
/* /*
* These are mainly provided to allow for a change of implementation if a device * These are mainly provided to allow for a change of implementation if a device
* has a large number of scan elements * has a large number of scan elements