usb: gadget: langwell_udc: add usb test mode support

This patch adds test mode support for Langwell gadget driver.

Signed-off-by: Henry Yuan <hang.yuan@intel.com>
Signed-off-by: Andy Luo <yifei.luo@intel.com>
Signed-off-by: Greg Kroah-Hartman <gregkh@suse.de>
This commit is contained in:
Luo Andy
2010-11-23 10:41:21 +08:00
committed by Greg Kroah-Hartman
parent b23f2f9413
commit 7fc56f0d99
2 changed files with 33 additions and 0 deletions

View File

@@ -123,6 +123,16 @@
#define USB_DEVICE_A_ALT_HNP_SUPPORT 5 /* (otg) other RH port does */
#define USB_DEVICE_DEBUG_MODE 6 /* (special devices only) */
/*
* Test Mode Selectors
* See USB 2.0 spec Table 9-7
*/
#define TEST_J 1
#define TEST_K 2
#define TEST_SE0_NAK 3
#define TEST_PACKET 4
#define TEST_FORCE_EN 5
/*
* New Feature Selectors as added by USB 3.0
* See USB 3.0 spec Table 9-6