lk/linux-kernel-test
1
0
Fork 0
Code Issues Pull Requests Releases Wiki Activity

igb: Fix reg pattern test in ethtool for i350 devices

Browse Source 
This fixes the reg_pattern_test so that the test does not fail
on i350 parts.

Signed-off-by: Carolyn Wyborny <carolyn.wyborny@intel.com>
Tested-by: Jeff Pieper <jeffrey.e.pieper@intel.com>
Signed-off-by: Jeff Kirsher <jeffrey.t.kirsher@intel.com>
This commit is contained in:
Carolyn Wyborny
2011-02-24 03:12:15 +00:00
committed by Jeff Kirsher
parent 9b082d734a
commit 93ed835928
1 changed files with 1 additions and 1 deletions
Download Patch File Download Diff File Expand all files Collapse all files

2
drivers/net/igb/igb_ethtool.c
View File

@@ -1070,7 +1070,7 @@ static bool reg_pattern_test(struct igb_adapter *adapter, u64 *data,
{0x5A5A5A5A, 0xA5A5A5A5, 0x00000000, 0xFFFFFFFF}; {0x5A5A5A5A, 0xA5A5A5A5, 0x00000000, 0xFFFFFFFF};
for (pat = 0; pat < ARRAY_SIZE(_test); pat++) { for (pat = 0; pat < ARRAY_SIZE(_test); pat++) {
wr32(reg, (_test[pat] & write)); wr32(reg, (_test[pat] & write));
val = rd32(reg); val = rd32(reg) & mask;
if (val != (_test[pat] & write & mask)) { if (val != (_test[pat] & write & mask)) {
dev_err(&adapter->pdev->dev, "pattern test reg %04X " dev_err(&adapter->pdev->dev, "pattern test reg %04X "
"failed: got 0x%08X expected 0x%08X\n", "failed: got 0x%08X expected 0x%08X\n",